Title :
Fault-Tolerant 256K Memory Designs
Author :
Tanner, R. Michael
Author_Institution :
Department of Computer and Information Sciences, University of Califomia
fDate :
4/1/1984 12:00:00 AM
Abstract :
A series of designs for a 256K memory are presented which integrate error-correcting coding into the memory organization. Starting from a simple single-error correcting product code, the successive designs explore trade-offs in coding efficiency, access delay, and complexity of communication and computation. In the most powerful design, all the 256K bits are organized so that they form a codeword in a double-error-correcting triple-error-detecting code derived from a projective plane. Because all of the bits are components of this single codeword, the coding efficiency is very high; the required parity check bits increase the storage by only 3 percent, approximately. Single error correction can take place at the time of a read with very little additional delay compared to that of a normal irredundant memory. Multiple error correction can be performed by the memory management system. A variety of failure modes, including failure of a whole column of one of the constituent 64 x 64 subarrays can be tolerated. Writing into the memory is somewhat slower than in a conventional memory, involving a read-write cycle.
Keywords :
Distributed; VLSI; error-correction; fault-tolerant; memory; parallel; projective plane graph; redundancy; Added delay; Delay effects; Error correction; Error correction codes; Fault tolerance; Memory management; Parity check codes; Product codes; Read-write memory; Very large scale integration; Distributed; VLSI; error-correction; fault-tolerant; memory; parallel; projective plane graph; redundancy;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1984.1676436