Title :
Quantitative Analysis of Carbon Brush Treatments Using X-Ray Photometer Absorption Method [includes discussion]
Author_Institution :
NONMEMBER AIEE, General Electric Company, Schenectady, N. Y.
Keywords :
Aluminum; Brushes; Capacitors; Chemical analysis; Electromagnetic wave absorption; Instruments; Laboratories; Photoelectricity; Photometry; Surges;
Journal_Title :
Power Apparatus and Systems, Part III. Transactions of the American Institute of Electrical Engineers
DOI :
10.1109/AIEEPAS.1954.4498942
