DocumentCode
1150530
Title
Impact of Al composition on RF noise figure of AlGaAs/GaAs heterojunction bipolar transistors
Author
Costa, Damian
Author_Institution
PCSI, San Diego, CA, USA
Volume
42
Issue
12
fYear
1995
fDate
12/1/1995 12:00:00 AM
Firstpage
2043
Lastpage
2046
Abstract
The influence of Al content on the RF noise characteristics of Al xGa1-xAs/GaAs heterojunction bipolar transistors (HBT´s) is presented. It is shown that the minimum noise figure (Fmin) at 2 GHz is reduced by increasing the Al mole fraction (x). This observed improvement in noise figure is directly correlated to the differences in dc current gain. The lowest measured Fmin(2 GHz) of HBT´s with emitter dimensions 2×(3.5×30) μm2, were 1.3, 1.61, and 2.1 dB for x=0.35, 0.30, and 0.25 devices, respectively at Ic=3 mA. The measured results were found to agree well with calculated values over a wide range of collector currents
Keywords
III-V semiconductors; UHF bipolar transistors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; semiconductor device noise; 1.3 to 2.1 dB; 2 GHz; Al composition; AlGaAs-GaAs; AlGaAs/GaAs heterojunction bipolar transistors; DC current gain; RF noise; minimum noise figure; Artificial intelligence; Bipolar transistors; Current measurement; Gallium arsenide; Heterojunction bipolar transistors; Instruments; Noise figure; Passivation; Radio frequency; Thermal resistance;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.477759
Filename
477759
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