• DocumentCode
    1150530
  • Title

    Impact of Al composition on RF noise figure of AlGaAs/GaAs heterojunction bipolar transistors

  • Author

    Costa, Damian

  • Author_Institution
    PCSI, San Diego, CA, USA
  • Volume
    42
  • Issue
    12
  • fYear
    1995
  • fDate
    12/1/1995 12:00:00 AM
  • Firstpage
    2043
  • Lastpage
    2046
  • Abstract
    The influence of Al content on the RF noise characteristics of Al xGa1-xAs/GaAs heterojunction bipolar transistors (HBT´s) is presented. It is shown that the minimum noise figure (Fmin) at 2 GHz is reduced by increasing the Al mole fraction (x). This observed improvement in noise figure is directly correlated to the differences in dc current gain. The lowest measured Fmin(2 GHz) of HBT´s with emitter dimensions 2×(3.5×30) μm2, were 1.3, 1.61, and 2.1 dB for x=0.35, 0.30, and 0.25 devices, respectively at Ic=3 mA. The measured results were found to agree well with calculated values over a wide range of collector currents
  • Keywords
    III-V semiconductors; UHF bipolar transistors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; semiconductor device noise; 1.3 to 2.1 dB; 2 GHz; Al composition; AlGaAs-GaAs; AlGaAs/GaAs heterojunction bipolar transistors; DC current gain; RF noise; minimum noise figure; Artificial intelligence; Bipolar transistors; Current measurement; Gallium arsenide; Heterojunction bipolar transistors; Instruments; Noise figure; Passivation; Radio frequency; Thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.477759
  • Filename
    477759