• DocumentCode
    1150777
  • Title

    Verification Testing—A Pseudoexhaustive Test Technique

  • Author

    McCluskey, Edward J.

  • Author_Institution
    Center for Reliable Computing, Computer Systems Laboratory, Stanford University
  • Issue
    6
  • fYear
    1984
  • fDate
    6/1/1984 12:00:00 AM
  • Firstpage
    541
  • Lastpage
    546
  • Abstract
    A new approach to test pattern generation which is particularly suitable for self-test is described. Required computation time is much less than for present day automatic test pattern generation (ATPG) programs. Fault simulation or fault modeling is not required. More patterns may be obtained than from standard ATPG programs. However, fault coverage is much higher—all irredundant multiple as well as single stuck faults are detected. The test patterns are easily generated algorithmically either by program or hardware.
  • Keywords
    Autonomous test; built-in self-test; pseudoexhaustive test; test pattern generation; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Computational modeling; Computer networks; Costs; Fault detection; Military computing; Test pattern generators; Autonomous test; built-in self-test; pseudoexhaustive test; test pattern generation;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1984.1676477
  • Filename
    1676477
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1150777