Title :
Built-In Testing of One-Dimensional Unilateral Iterative Arrays
Author :
Aboulhamid, E.M. ; Cerny, E.
Author_Institution :
Département de Mathématiques et Informatique, Universitédu Québec
fDate :
6/1/1984 12:00:00 AM
Abstract :
It has been shown in the literature that C-testable iterative arrays have very simple test structures, independent of the length of the arrays. We show in this work that all C-testable arrays are also pI-testable, which is a property yielding, in many cases, rather simple built-in-testing structures, both for the test generator and for the response verifier.
Keywords :
Built-in testing; C-testability; iterative logic arrays; test generation; testability; Circuit faults; Circuit testing; Combinational circuits; Large scale integration; Logic arrays; Logic devices; Logic testing; Performance evaluation; Built-in testing; C-testability; iterative logic arrays; test generation; testability;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1984.1676481
