DocumentCode :
1150817
Title :
Built-In Testing of One-Dimensional Unilateral Iterative Arrays
Author :
Aboulhamid, E.M. ; Cerny, E.
Author_Institution :
Département de Mathématiques et Informatique, Universitédu Québec
Issue :
6
fYear :
1984
fDate :
6/1/1984 12:00:00 AM
Firstpage :
560
Lastpage :
564
Abstract :
It has been shown in the literature that C-testable iterative arrays have very simple test structures, independent of the length of the arrays. We show in this work that all C-testable arrays are also pI-testable, which is a property yielding, in many cases, rather simple built-in-testing structures, both for the test generator and for the response verifier.
Keywords :
Built-in testing; C-testability; iterative logic arrays; test generation; testability; Circuit faults; Circuit testing; Combinational circuits; Large scale integration; Logic arrays; Logic devices; Logic testing; Performance evaluation; Built-in testing; C-testability; iterative logic arrays; test generation; testability;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1984.1676481
Filename :
1676481
Link To Document :
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