• DocumentCode
    1150817
  • Title

    Built-In Testing of One-Dimensional Unilateral Iterative Arrays

  • Author

    Aboulhamid, E.M. ; Cerny, E.

  • Author_Institution
    Département de Mathématiques et Informatique, Universitédu Québec
  • Issue
    6
  • fYear
    1984
  • fDate
    6/1/1984 12:00:00 AM
  • Firstpage
    560
  • Lastpage
    564
  • Abstract
    It has been shown in the literature that C-testable iterative arrays have very simple test structures, independent of the length of the arrays. We show in this work that all C-testable arrays are also pI-testable, which is a property yielding, in many cases, rather simple built-in-testing structures, both for the test generator and for the response verifier.
  • Keywords
    Built-in testing; C-testability; iterative logic arrays; test generation; testability; Circuit faults; Circuit testing; Combinational circuits; Large scale integration; Logic arrays; Logic devices; Logic testing; Performance evaluation; Built-in testing; C-testability; iterative logic arrays; test generation; testability;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1984.1676481
  • Filename
    1676481