Title :
n+-SnO2/a-SiC:H/metal thin-film photodiodes with voltage-controlled spectral sensitivity
Author :
Rossi, Maria Cristina ; Vincenzoni, Raffaella ; Galluzzi, Fabrizio
Author_Institution :
Dipartimento di Ingegneria Elettronica, Rome Univ., Italy
fDate :
12/1/1995 12:00:00 AM
Abstract :
n+-SnO2/a-SiC/metal photodiodes with voltage-controlled photosensitivity have been realized by using both carbon-rich and silicon-rich a-SiC alloys. Carbon-rich devices show a response peak located at 530 nm independent of the applied voltage, which in turn only affects the peak height. At variance, in silicon-rich structures the response peak is located at 480, 510, and 570 nm when the applied voltage is -4, 0, and +4 V, respectively, with corresponding quantum yield values of 17, 3, and 25%. For explaining the observed behavior we present a simple model of n+-SnO2/a-SiC/metal diodes, which takes into account light-induced modulation of n+-SnO2/a-SiC barrier height, primary photocurrent generation and photoconductivity effects
Keywords :
aluminium; amorphous semiconductors; gold; hydrogen; photodetectors; photodiodes; semiconductor device models; semiconductor materials; silicon compounds; tin compounds; -4 to 4 V; 480 to 570 nm; C-rich a-SiC alloys; I-V characteristics; Si-rich a-SiC alloys; SnO2-SiC:H-Al; SnO2-SiC:H-Au; applied voltage; dark currents; light currents; light-induced modulation; model; n+-SnO2/a-SiC:H/metal thin-film photodiodes; peak height; photoconductivity effects; primary photocurrent generation; quantum yield values; response peak; voltage-controlled photosensitivity; voltage-controlled spectral sensitivity; Contacts; Diodes; Electric variables; Gold; Optical films; Photoconductivity; Photodiodes; Silicon alloys; Silicon carbide; Voltage; Voltage control;
Journal_Title :
Electron Devices, IEEE Transactions on