Title :
Effect of seed and interface layers on the magnetic properties of laminated Fe-Al-N films
Author :
Maass, W. ; Rohrmann, H. ; Kling, N.-U. ; Langer, J. ; Mattheis, R. ; Senz, S. ; McNeill, K.A.
Author_Institution :
Unaxis GmbH, Alzenau, Germany
fDate :
1/1/2003 12:00:00 AM
Abstract :
We have prepared several sets of multilayers [S/Fe-Al-N]N by radio-frequency-diode sputtering, using NiFe and Al2O3 as spacer S. We investigated magnetic and structural properties as a function of spacer and Fe-Al-N thickness. By transmission electron microscopy and X-ray diffraction investigations, we could show that the doping of the Fe with Al as well as the nitriding effect of the Ar/N2 sputtering atmosphere results in a nanocrystalline structure, leading to coercivities below 2.5 Oe in all films. Optimized lamination improves the properties to give excellent soft magnetic behavior with easy axis coercivity <0.5 Oe and closed hard-axis hysteresis loops with Hk in the range of a few oersteds. The observed degradation of this soft magnetism when the lamination is changed cannot be explained solely by changes of the structural properties.
Keywords :
X-ray diffraction; aluminium alloys; coercive force; ferromagnetic materials; iron alloys; laminates; magnetic hysteresis; magnetic multilayers; magnetic recording; nanostructured materials; soft magnetic materials; sputter deposition; transmission electron microscopy; Al2O3 spacer; Ar-N2; Ar/N2 sputtering atmosphere; FeAlN-Al2O3; FeAlN-NiFe; NiFe spacer layer; X-ray diffraction; closed hard-axis hysteresis loops; coercivities; easy axis coercivity; interface layers; laminated Fe-Al-N films; magnetic properties; multilayers; nanocrystalline structure; nitriding effect; optimized lamination; radio-frequency-diode sputtering; seed layers; soft magnetic behavior; structural properties; transmission electron microscopy; Coercive force; Lamination; Magnetic films; Magnetic multilayers; Magnetic properties; Radio frequency; Soft magnetic materials; Sputtering; Transmission electron microscopy; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2002.806342