DocumentCode
1151172
Title
Monolithic AlGaAs-GaAs single quantum-well ridge lasers fabricated with dry-etched facets and ridges
Author
Behfar-Rad, A. ; Wong, S.S.
Author_Institution
IBM, Hopewell Junction, NY, USA
Volume
28
Issue
5
fYear
1992
fDate
5/1/1992 12:00:00 AM
Firstpage
1227
Lastpage
1231
Abstract
A process has been developed to allow the fabrication of self-aligned etched-facet ridge lasers. The ridge lasers have both their facets and ridges formed through the use of the chemically assisted ion beam etching technique. The ridge and facet of these lasers are self-aligned so that any misalignment during the photolithography does not affect positioning of the laser ridge with respect to the facet. A cavity with a length as short as 3 μ has been fabricated. The longitudinal mode spacing has been experimentally measured as a function of inverse cavity length for both the n QW=1 and 2 transitions, and the corresponding dispersion terms have been determined
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; laser cavity resonators; laser modes; semiconductor junction lasers; sputter etching; AlGaAs-GaAs; III-V semiconductors; chemically assisted ion beam etching technique; dispersion terms; dry-etched facets; fabrication; inverse cavity length; longitudinal mode spacing; misalignment; monolithic AlGaAs-GaAs single quantum well ridge lasers; photolithography; self-aligned etched-facet ridge lasers; transitions; Chemical lasers; Etching; Fiber lasers; Laser modes; Laser transitions; Optical refraction; Plasma applications; Quantum well lasers; Resists; Semiconductor lasers;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.135259
Filename
135259
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