• DocumentCode
    1151172
  • Title

    Monolithic AlGaAs-GaAs single quantum-well ridge lasers fabricated with dry-etched facets and ridges

  • Author

    Behfar-Rad, A. ; Wong, S.S.

  • Author_Institution
    IBM, Hopewell Junction, NY, USA
  • Volume
    28
  • Issue
    5
  • fYear
    1992
  • fDate
    5/1/1992 12:00:00 AM
  • Firstpage
    1227
  • Lastpage
    1231
  • Abstract
    A process has been developed to allow the fabrication of self-aligned etched-facet ridge lasers. The ridge lasers have both their facets and ridges formed through the use of the chemically assisted ion beam etching technique. The ridge and facet of these lasers are self-aligned so that any misalignment during the photolithography does not affect positioning of the laser ridge with respect to the facet. A cavity with a length as short as 3 μ has been fabricated. The longitudinal mode spacing has been experimentally measured as a function of inverse cavity length for both the nQW=1 and 2 transitions, and the corresponding dispersion terms have been determined
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; laser cavity resonators; laser modes; semiconductor junction lasers; sputter etching; AlGaAs-GaAs; III-V semiconductors; chemically assisted ion beam etching technique; dispersion terms; dry-etched facets; fabrication; inverse cavity length; longitudinal mode spacing; misalignment; monolithic AlGaAs-GaAs single quantum well ridge lasers; photolithography; self-aligned etched-facet ridge lasers; transitions; Chemical lasers; Etching; Fiber lasers; Laser modes; Laser transitions; Optical refraction; Plasma applications; Quantum well lasers; Resists; Semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.135259
  • Filename
    135259