Title :
The Effect of Reclosing Practice on Short-Circuit Thermal Limits for Transformers [includes discussion]
Author_Institution :
FELLOW AIEE, consulting engineer, Schenectady, N. Y.
Keywords :
Assembly; Breakdown voltage; Circuits; Ionization; Laboratories; Protection; Radioactive materials; Temperature; Testing; Transformers;
Journal_Title :
Power Apparatus and Systems, Part III. Transactions of the American Institute of Electrical Engineers
DOI :
10.1109/AIEEPAS.1954.4499028
