• DocumentCode
    1151373
  • Title

    The Effect of Reclosing Practice on Short-Circuit Thermal Limits for Transformers [includes discussion]

  • Author

    Clem, J.E.

  • Author_Institution
    FELLOW AIEE, consulting engineer, Schenectady, N. Y.
  • Volume
    73
  • Issue
    2
  • fYear
    1954
  • Keywords
    Assembly; Breakdown voltage; Circuits; Ionization; Laboratories; Protection; Radioactive materials; Temperature; Testing; Transformers;
  • fLanguage
    English
  • Journal_Title
    Power Apparatus and Systems, Part III. Transactions of the American Institute of Electrical Engineers
  • Publisher
    ieee
  • ISSN
    0097-2460
  • Type

    jour

  • DOI
    10.1109/AIEEPAS.1954.4499028
  • Filename
    4499028