Title :
Broadband Characterization of Complex Permittivity for Low-Loss Dielectrics: Circular PC Board Disk Approach
Author :
Guo, Zhonghai ; Pan, Guangwen George ; Hall, Stephen ; Pan, Christopher
Author_Institution :
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
Abstract :
We present a nondestructive method for determination of the permittivity and loss tangent of low-loss dielectrics using printed circuit board (PCB) circular disks. Because it utilizes multiple resonances, this method is in high precision and broadband (500 MHz-12 GHz), covering the UHF, GSM 850/1800, 802.11b/g, WiMax, WLAN, and UWB bands. The method is simple and accurate based on closed-form analytic expressions of cylindrical symmetry, taking into account disk rim fringing fields and radiation loss. Numerical results are conducted for popular PCB material, FR4, and the self-consistent Kramers-Kronig (KK) relation is verified.
Keywords :
Kramers-Kronig relations; UHF measurement; dielectric materials; microwave measurement; nondestructive testing; permittivity; permittivity measurement; printed circuit testing; FR4; GSM band; UHF band; UWB bands; WLAN band; WiMax band; broadband characterization; circular PC board disk approach; complex permittivity; cylindrical symmetry; disk rim fringing fields; frequency 500 MHz to 12 GHz; loss tangent; low-loss dielectrics; nondestructive method; printed circuit board circular disks; radiation loss; self-consistent Kramers-Kronig relation; Antenna measurements; Circuit testing; Coaxial components; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Frequency; GSM; Loss measurement; Permittivity measurement; Resonance; WiMAX; Wireless LAN; Dielectric measurements; high-speed digital circuit; loss tangent; microwave measurements; real permittivity; self-consistency;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
DOI :
10.1109/TAP.2009.2028525
