Title :
A useful and challenging take-home examination: characterization of an imaginary semiconductor sample
Author :
Listerman, Thomas W.
Author_Institution :
Dept. of Phys., Wright State Univ., Dayton, OH, USA
fDate :
8/1/1994 12:00:00 AM
Abstract :
A take-home examination required students in a semiconductor device physics course to clarify their understanding of the properties of semiconductors. Students were given numerical values of measurements “made” on an imaginary semiconductor and then asked to determine the semiconductor´s physical characteristics
Keywords :
educational courses; electronic engineering; semiconductor devices; imaginary semiconductor sample; measurements; physical characterization; semiconductor device physics course; students; take-home examination; Books; Cyclotrons; Data analysis; Equations; Magnetic field measurement; Physics; Resonance; Semiconductor device doping; Semiconductor devices; Semiconductor materials;
Journal_Title :
Education, IEEE Transactions on
