DocumentCode :
1151638
Title :
A useful and challenging take-home examination: characterization of an imaginary semiconductor sample
Author :
Listerman, Thomas W.
Author_Institution :
Dept. of Phys., Wright State Univ., Dayton, OH, USA
Volume :
37
Issue :
3
fYear :
1994
fDate :
8/1/1994 12:00:00 AM
Firstpage :
319
Lastpage :
321
Abstract :
A take-home examination required students in a semiconductor device physics course to clarify their understanding of the properties of semiconductors. Students were given numerical values of measurements “made” on an imaginary semiconductor and then asked to determine the semiconductor´s physical characteristics
Keywords :
educational courses; electronic engineering; semiconductor devices; imaginary semiconductor sample; measurements; physical characterization; semiconductor device physics course; students; take-home examination; Books; Cyclotrons; Data analysis; Equations; Magnetic field measurement; Physics; Resonance; Semiconductor device doping; Semiconductor devices; Semiconductor materials;
fLanguage :
English
Journal_Title :
Education, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9359
Type :
jour
DOI :
10.1109/13.312146
Filename :
312146
Link To Document :
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