DocumentCode
1151701
Title
The Histogram Test of ADCs With Sinusoidal Stimulus Is Unbiased by Phase Noise
Author
Alegria, Francisco Corrêa ; Serra, António Cruz
Author_Institution
Inst. de Telecomun., Tech. Univ. of Lisbon, Lisbon, Portugal
Volume
58
Issue
11
fYear
2009
Firstpage
3847
Lastpage
3854
Abstract
This paper intends to show that the presence of normally distributed phase noise or jitter in the test setup or in the analog-to-digital converter (ADC) itself does not cause a bias in the sinusoidal histogram test estimation of the transfer function of an ADC. The analytical proof presented demonstrates that there is no need to use an extra overdrive when stimulating the ADC, as is the case with amplitude noise.
Keywords
analogue-digital conversion; jitter; transfer functions; ADC; analog-to-digital converter; jitter; phase noise; sinusoidal histogram test estimation; sinusoidal stimulus; transfer function; Analog-to-digital converter (ADC); bias; histogram test; jitter; phase noise;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2009.2020842
Filename
5175312
Link To Document