• DocumentCode
    1151701
  • Title

    The Histogram Test of ADCs With Sinusoidal Stimulus Is Unbiased by Phase Noise

  • Author

    Alegria, Francisco Corrêa ; Serra, António Cruz

  • Author_Institution
    Inst. de Telecomun., Tech. Univ. of Lisbon, Lisbon, Portugal
  • Volume
    58
  • Issue
    11
  • fYear
    2009
  • Firstpage
    3847
  • Lastpage
    3854
  • Abstract
    This paper intends to show that the presence of normally distributed phase noise or jitter in the test setup or in the analog-to-digital converter (ADC) itself does not cause a bias in the sinusoidal histogram test estimation of the transfer function of an ADC. The analytical proof presented demonstrates that there is no need to use an extra overdrive when stimulating the ADC, as is the case with amplitude noise.
  • Keywords
    analogue-digital conversion; jitter; transfer functions; ADC; analog-to-digital converter; jitter; phase noise; sinusoidal histogram test estimation; sinusoidal stimulus; transfer function; Analog-to-digital converter (ADC); bias; histogram test; jitter; phase noise;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2009.2020842
  • Filename
    5175312