DocumentCode :
1151800
Title :
Segmented Testing
Author :
Robinson, John P.
Author_Institution :
Department of Electrical and Computer Engineering, University of Iowa
Issue :
5
fYear :
1985
fDate :
5/1/1985 12:00:00 AM
Firstpage :
467
Lastpage :
471
Abstract :
The fraction of faults detected for a digital network is frequently high for the first few input combinations applied out of a set of test vectors. For on-line testing, there appears to be an advantage to splitting the test into segments which are applied at different times. It is shown that the expected time to error detection and the probability of an undetected double error can be reduced. The amount of reduction is dependent on the shape of the fault coverage curve. This approach may be applicable in fault-tolerant systems.
Keywords :
Detection probability; fault coverage; fault tolerant; testing; Built-in self-test; Circuit faults; Circuit testing; Error correction; Fault detection; Fault tolerance; Fault tolerant systems; Logic gates; Shape; System testing; Detection probability; fault coverage; fault tolerant; testing;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1985.1676586
Filename :
1676586
Link To Document :
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