DocumentCode
1151897
Title
1.3 μm InAs/GaAs multilayer quantum-dot laser with extremely low room-temperature threshold current density
Author
Sellers, I.R. ; Liu, H.Y. ; Groom, K.M. ; Childs, D.T. ; Robbins, D. ; Badcock, T.J. ; Hopkinson, M. ; Mowbray, D.J. ; Skolnick, M.S.
Author_Institution
Dept. of Phys. & Astron., Univ. of Sheffield, UK
Volume
40
Issue
22
fYear
2004
Firstpage
1412
Lastpage
1413
Abstract
A high growth temperature step used for the GaAs spacer layer is shown to significantly improve the performance of 1.3 μm multilayer InAs/GaAs quantum-dot lasers. Extremely low room-temperature continuous-wave threshold current densities of 32.5 and 17 A/cm2 are achieved for a three-layer device with as-cleaved facets and high-reflectivity coated facets, respectively.
Keywords
III-V semiconductors; current density; electroluminescence; electroluminescent devices; gallium arsenide; indium compounds; molecular beam epitaxial growth; multilayers; quantum dot lasers; semiconductor epitaxial layers; sputter etching; waveguide lasers; 1.3 micron; 293 to 298 K; InAs-GaAs; cleaved facets; multilayer quantum dot laser; reflectivity coated facets; room-temperature threshold current density; three layer device;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20046692
Filename
1352857
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