Title :
A Precise Analysis of the IEC Flickermeter When Subject to Rectangular Voltage Fluctuations
Author :
Ruiz, J. ; Gutierrez, J.J. ; Irusta, U. ; Lazkano, A.
Author_Institution :
Electron. & Telecommun. Dept., Univ. of the Basque Country, Bilbao, Spain
Abstract :
The Pst measured using the International Electrotechnical Commission (IEC) flickermeter for a rectangular fluctuation is discontinuous for certain values of the frequency of fluctuation. These discontinuities do not represent a real physiological perception of flicker, but they are a consequence of the nonlinear behavior of blocks 1, 4, and 5 of the IEC flickermeter. We have theoretically proved the origin of these discontinuities, and we have experimentally identified and quantified them. Although these discontinuities do not influence the Pst values recorded in the field, they are an intrinsic characteristic of the flickermeter model proposed in the IEC 61000-4-15 standard. This paper contributes to a better understanding of how the IEC flickermeter works when subject to rectangular fluctuations. Furthermore, the identification and quantification of these discontinuities can help to improve the design of the performance tests of the flickermeter.
Keywords :
IEC standards; power supply quality; voltmeters; IEC 61000-4-15 standard; IEC flickermeter; International Electrotechnical Commission; frequency fluctuation; power quality; rectangular voltage fluctuations; $P_{st}$; International Electrotechnical Commission (IEC) flickermeter; power quality; rectangular voltage fluctuation;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2009.2020837