DocumentCode :
1151954
Title :
Tool for Automated Instruction Set Characterization for Software Power Estimation
Author :
Wendt, Manuel ; Grumer, Matthias ; Steger, Christian ; Weiss, Reinhold ; Neffe, Ulrich ; Muehlberger, Andreas
Author_Institution :
Bus. Line Identification, NXP Semicond., Gratkorn, Austria
Volume :
59
Issue :
1
fYear :
2010
Firstpage :
84
Lastpage :
91
Abstract :
The complexity and functionality of mobile digital devices is continuously growing. This results in a higher energy consumption of such devices. To counteract this trend, it is mandatory to accomplish software power optimizations based on accurate power consumption models characterized for the processor. This paper presents an environment for automated instruction set characterization based on physical power measurements. The generic design of this characterization system enables an easy portability to other architectures. For an accurate current measurement, a high-performance sampling technique has been established, which can be either clock or energy driven. The performance of those techniques is analyzed, and the advantages over the conventional solution of a series resistor are discussed. During the characterization of different processor platforms, it could be shown that the characterization effort can be reduced from three man-months to two man-weeks.
Keywords :
electronic engineering computing; embedded systems; instruction sets; microprocessor chips; mobile computing; power aware computing; accurate power consumption model characterization; automated processor instruction set characterization; embedded processor; high-performance sampling technique; mobile digital device; physical power measurements; power-aware computing; software power estimation; software power optimization; Automated instruction set characterization; embedded processors; power measurement; power-aware computing; software power estimation; testbench generator;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2009.2021646
Filename :
5175334
Link To Document :
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