Title :
Correction to "Modeling and Test Generation Algorithms for MOS Circuits"
fDate :
7/1/1985 12:00:00 AM
Abstract :
In the above paper,1 the authors´ photographs were inadvertently switched. The biographies and photographs should have appeared as follows.
Keywords :
Automatic testing; Circuit testing; Design automation; EMP radiation effects; Education; Logic testing; Radar antennas; Space technology; System testing; Very large scale integration;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1985.1676609
