DocumentCode :
115210
Title :
Optimal DoS attacks on Bayesian quickest change detection
Author :
Xiaoqiang Ren ; Yilin Mo ; Ling Shi
Author_Institution :
Dept. of Eletronic & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
fYear :
2014
fDate :
15-17 Dec. 2014
Firstpage :
3765
Lastpage :
3770
Abstract :
In this paper, the optimal denial-of-service (DoS) attack strategies on Bayesian quickest change detection are developed. Specifically, a sensor monitoring an environment that may change randomly sends its observation at each time via a wireless channel to a remote center. Upon receiving the data from the sensor, the remote center decides sequentially whether a change of the environment takes place or not and the remote center aims to detect such a change as soon as possible subject to a certain false alarm rate. An attacker eavesdropping the wireless channel can launch jamming attacks (e.g., block the wireless channel) between the sensor and the remote center for at most N times. To make the detection cost (a linear combination of detection delay and the probability of false alarm) for the center as large as possible, the attacker needs to decide when to implement such DoS attacks. We solve this problem by formulating it as an infinite horizon MDP problem. The asymptotic lower and upper bound of the expected detection delay at the center, when the probability of false alarm goes to zero, of such an attack is also investigated. A numerical example is shown to illustrate the main results.
Keywords :
Bayes methods; computer network security; jamming; Bayesian quickest change detection; asymptotic lower; detection delay; false alarm rate; infinite horizon MDP problem; jamming attacks; optimal DoS attacks; optimal denial-of-service; remote center; wireless channel; Bayes methods; Computer crime; Delays; Jamming; Mathematical model; Wireless communication; Wireless sensor networks; Change Detection; DoS attacks; MDP;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control (CDC), 2014 IEEE 53rd Annual Conference on
Conference_Location :
Los Angeles, CA
Print_ISBN :
978-1-4799-7746-8
Type :
conf
DOI :
10.1109/CDC.2014.7039975
Filename :
7039975
Link To Document :
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