• DocumentCode
    1152509
  • Title

    The Bidirectional Double Latch (BDDL)

  • Author

    Savir, Jacob

  • Author_Institution
    IBM Data Systems Division
  • Issue
    1
  • fYear
    1986
  • Firstpage
    65
  • Lastpage
    66
  • Abstract
    This paper describes a new type of shift register latch that is compatible with LSSD. The new latch has the property that information may be shifted in and out of it in two directions: left to right and right to left.
  • Keywords
    Design for testability; LSSD; hardware overhead; shift register failure diagnostics; shift register latch; Boolean functions; Circuit testing; Data structures; Hardware; Latches; Logic testing; Sequential analysis; Sequential circuits; Shift registers; Very large scale integration; Design for testability; LSSD; hardware overhead; shift register failure diagnostics; shift register latch;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1986.1676659
  • Filename
    1676659
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1152509