Title :
A Note on the Restricted Range Cutting Algorithm
Author_Institution :
Usine IBM France
Abstract :
In [1], an algorithm to compute bounds on signal probabilities in VLSI nets is provided.
Keywords :
Cutting algorithm; random pattern; signal probability; testability; Computer science; Contracts; Cross layer design; Image processing; Military computing; Pixel; Testing; Very large scale integration; Cutting algorithm; random pattern; signal probability; testability;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1986.1676662
