DocumentCode :
1152592
Title :
Comments on "The Diogenes Approach to Testable Fault-Tolerant Arrays of Processors"
Author :
Koren, Israel
Author_Institution :
Department of Electrical Engineering, Technion—Israel Institute of Technology
Issue :
1
fYear :
1986
Firstpage :
93
Lastpage :
93
Abstract :
The above paper1presents an approach to the design of fault- tolerant processor arrays. In Section IV of this paper (related work on fault-tolerant networks) the author criticizes a previously published approach presented by Koren [1] and by Gordon, Koren and Silberman [2]. In [1], an algorithm for structuring a linear array on a rectangular grid of processing elements (PE´s), some of which may be faulty, is presented. Since similar structuring algorithms for other structures like square arrays and binary trees (in the presence of faulty PE´s) are more complicated, a different strategy has been suggested in [1]. According to it, all PE´s in the same row or column of the faulty processor will turn into connecting elements (CE´s) and will not participate in any future processing task. The remaining PE´s still constitute a rectangular grid with one less row and one less column. Consequently, the same structuring algorithms (for fault- free arrays) can be used and in many cases the grid will admit the same size of a binary tree as before [1]. If the communication link between two neighboring processors fails, only the processors within the corresponding single row or column will be declared CE´s. In [2], a similar strategy has been applied to hexagonal arrays.
Keywords :
Binary trees; Costs; Fault tolerance; Joining processes; Manufacturing; Process design; Production; Silicon; Testing; Very large scale integration;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1986.1676668
Filename :
1676668
Link To Document :
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