• DocumentCode
    1153028
  • Title

    Rapid near-field antenna testing via arrays of modulated scattering probes

  • Author

    Bolomey, J.-C. ; Cown, Barry J. ; Fine, G. ; Jofre, Lluis ; Mostafavi, Masoud ; Picard, David ; Estrada, John P. ; Friederich, Paul G. ; Cain, Fred L.

  • Author_Institution
    Lab. de Signaux et Syst., Ecole Superieure d´´Electr., Gif-sur-Yvette, France
  • Volume
    36
  • Issue
    6
  • fYear
    1988
  • fDate
    6/1/1988 12:00:00 AM
  • Firstpage
    804
  • Lastpage
    814
  • Abstract
    Key results are summarized of efforts to significantly reduce the near-field measurement time by utilizing one- or two-dimensional arrays of modulated scattering probes in lieu of the single probe ordinarily used in conventional near-field measurement techniques. Results of analytical, numerical, and experimental investigations show that the modulated-scattering technique (MST) using arrays of hundreds or even thousands of modulated scattering probes can be used to map the complex near-field of antennas or scatterers in a few seconds or minutes. The results also strongly indicate that classical (nonmodulated) receiving/transmitting arrays can be adapted for rapid near-field data collection. Major factors affecting the accuracy and speed of probe arrays for near-field measurement are delineated and discussed. Experimental results obtained using laboratory prototype MST systems are also presented and discussed
  • Keywords
    antenna radiation patterns; antennas; electric field measurement; electronic equipment testing; probes; accuracy; antenna near field mapping; modulated scattering probes; modulated-scattering technique; near-field antenna testing; near-field measurement time; probe arrays; rapid near-field data collection; speed; Adaptive arrays; Antenna arrays; Antenna measurements; Laboratories; Measurement techniques; Probes; Scattering; Testing; Time measurement; Velocity measurement;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.1182
  • Filename
    1182