• DocumentCode
    1153096
  • Title

    Spectral Signature Testing of Multiple Stuck-at Faults in Irredundant Combinational Networks

  • Author

    Lui, P.K. ; Muzio, J.C.

  • Author_Institution
    Department of Computer Science, University of Victoria
  • Issue
    12
  • fYear
    1986
  • Firstpage
    1088
  • Lastpage
    1092
  • Abstract
    Earlier spectral signature testing methods are extended to the multiple stuck-at fault model. The testability condition for multiple- input faults is established and a minimal spanning signature (MSS) is defined to cover all these faults. It is then shown that an MSS, which in most cases contains a single spectral coefficient, will detect over 99 percent of all input and internal multiple faults. An approach is described to obtain a complete signature for all multiple faults in any irredundant combinational network with comparatively small numbers of fan-outs. Tree networks that include XOR/XNOR gates are shown to be easily tested. Internally fan-out-free and general irredundant networks are also considered. A design approach is proposed to enable a network to be tested for all single and most multiple faults using a single coefficient, with the possible overhead being an extra control input.
  • Keywords
    Combinational network; fault detection; multiple stuckat faults; spectral signature testing; syndrome testing; Computer science; Councils; Design for testability; Fault detection; Hardware; Intelligent networks; Sequential analysis; Testing; Very large scale integration; Combinational network; fault detection; multiple stuckat faults; spectral signature testing; syndrome testing;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1986.1676719
  • Filename
    1676719