DocumentCode :
1153249
Title :
Early probabilistic noise estimation for capacitively coupled interconnects
Author :
Becer, Murat R. ; Blaauw, David ; Panda, Rajendran ; Hajj, Ibrahim N.
Author_Institution :
Adv. Tools Group, Motorola Inc., Austin, TX, USA
Volume :
22
Issue :
3
fYear :
2003
fDate :
3/1/2003 12:00:00 AM
Firstpage :
337
Lastpage :
345
Abstract :
One of the critical challenges in today´s high-performance IC design is to take noise into account as early as possible in the design cycle. Current noise analysis tools are effective at analyzing and identifying noise in the postroute design stage when detailed parasitic information is available. However, noise problems identified at this stage of the design cycle are very difficult to correct due to the limited flexibility in design and may cause additional iterations of routing and placement which adds costly delays in its time to market. In this paper, we introduce a probabilistic preroute noise analysis approach to identify postroute noise failures before the actual detailed route is completed. We introduce new methods to estimate the RC characteristics of victim and aggressor lines, their coupling capacitances, and the aggressor transition times before routing is performed. The approach is based on congestion information obtained from a global router. Since the exact location and relative position of wires in the design are not yet available, we propose a novel probabilistic method for capacitance extraction. We present results on two high-performance microprocessors in 0.18 μm technology that demonstrate the effectiveness of the proposed approach.
Keywords :
capacitance; circuit analysis computing; circuit layout CAD; crosstalk; integrated circuit interconnections; integrated circuit layout; integrated circuit noise; network routing; probability; 0.18 micron; RC characteristics; aggressor lines; aggressor transition times; capacitance extraction; capacitively coupled interconnects; congestion information; coupling capacitances; crosstalk noise; design cycle; early probabilistic noise estimation; global router; high-performance IC design; high-performance microprocessors; postroute noise failures identification; probabilistic extraction; probabilistic preroute noise analysis approach; victim lines; Added delay; Capacitance; Data mining; Delay effects; Failure analysis; Information analysis; Integrated circuit noise; Routing; Time to market; Wires;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2002.807892
Filename :
1182078
Link To Document :
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