DocumentCode
1153631
Title
Condensed Linear Feedback Shift Register (LFSR) Testing—A Pseudoexhaustive Test Technique
Author
Wang, Laung-Terng ; McCluskey, Edward J.
Author_Institution
Center for Reliable Computing, Computer Systems Laboratory, Departments of Electrical Engineering and Computer Science, Stanford University
Issue
4
fYear
1986
fDate
4/1/1986 12:00:00 AM
Firstpage
367
Lastpage
370
Abstract
This paper presents a design technique for linear feedback shift registers that generate test patterns for pseudoexhaustive testing. This technique is applicable to any combinational network in which none of the outputs depends on all inputs. It does not rewire the original network inputs during in-circuit test pattern generation. Thus, the possibility of undetected faults on some inputs is eliminated.
Keywords
Autonomous test; LFSR testing; built-in self-test; condensed LFSR testing; pseudoexhaustive testing; test pattern generation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Linear feedback shift registers; Polynomials; Test pattern generators; Autonomous test; LFSR testing; built-in self-test; condensed LFSR testing; pseudoexhaustive testing; test pattern generation;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1986.1676772
Filename
1676772
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