• DocumentCode
    1153641
  • Title

    Measurement and Application of Fault Latency

  • Author

    Shin, Kang G. ; Lee, Yann-Hang

  • Author_Institution
    Division of Computer Science and Engineering, Department of Electrical Engineering and Computer Science, University of Michigan
  • Issue
    4
  • fYear
    1986
  • fDate
    4/1/1986 12:00:00 AM
  • Firstpage
    370
  • Lastpage
    375
  • Abstract
    The time interval between the occurrence of a fault and the detection of the error caused by the fault is divided by the generation of that error into two parts: fault latency and error latency. Since the moment of error generation is not directly observable, all related works in the literature have dealt with only the sum of fault and error latencies, thereby making the analysis of their separate effects impossible. To remedy this deficiency, we 1) present a new methodology for indirectly measuring fault latency, 2) derive the distribution of fault latency from the methodology, and 3) apply the knowledge of fault latency to the analysis of two important examples.
  • Keywords
    Detection time; fault and error latency; fault injection; hazard rate; maximum likelihood estimator; Circuit faults; Computer errors; Delay; Fault detection; Fault tolerance; Hardware; Hazards; Maximum likelihood detection; NASA; Weibull distribution; Detection time; fault and error latency; fault injection; hazard rate; maximum likelihood estimator;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1986.1676773
  • Filename
    1676773