DocumentCode :
1153641
Title :
Measurement and Application of Fault Latency
Author :
Shin, Kang G. ; Lee, Yann-Hang
Author_Institution :
Division of Computer Science and Engineering, Department of Electrical Engineering and Computer Science, University of Michigan
Issue :
4
fYear :
1986
fDate :
4/1/1986 12:00:00 AM
Firstpage :
370
Lastpage :
375
Abstract :
The time interval between the occurrence of a fault and the detection of the error caused by the fault is divided by the generation of that error into two parts: fault latency and error latency. Since the moment of error generation is not directly observable, all related works in the literature have dealt with only the sum of fault and error latencies, thereby making the analysis of their separate effects impossible. To remedy this deficiency, we 1) present a new methodology for indirectly measuring fault latency, 2) derive the distribution of fault latency from the methodology, and 3) apply the knowledge of fault latency to the analysis of two important examples.
Keywords :
Detection time; fault and error latency; fault injection; hazard rate; maximum likelihood estimator; Circuit faults; Computer errors; Delay; Fault detection; Fault tolerance; Hardware; Hazards; Maximum likelihood detection; NASA; Weibull distribution; Detection time; fault and error latency; fault injection; hazard rate; maximum likelihood estimator;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1986.1676773
Filename :
1676773
Link To Document :
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