DocumentCode
1153641
Title
Measurement and Application of Fault Latency
Author
Shin, Kang G. ; Lee, Yann-Hang
Author_Institution
Division of Computer Science and Engineering, Department of Electrical Engineering and Computer Science, University of Michigan
Issue
4
fYear
1986
fDate
4/1/1986 12:00:00 AM
Firstpage
370
Lastpage
375
Abstract
The time interval between the occurrence of a fault and the detection of the error caused by the fault is divided by the generation of that error into two parts: fault latency and error latency. Since the moment of error generation is not directly observable, all related works in the literature have dealt with only the sum of fault and error latencies, thereby making the analysis of their separate effects impossible. To remedy this deficiency, we 1) present a new methodology for indirectly measuring fault latency, 2) derive the distribution of fault latency from the methodology, and 3) apply the knowledge of fault latency to the analysis of two important examples.
Keywords
Detection time; fault and error latency; fault injection; hazard rate; maximum likelihood estimator; Circuit faults; Computer errors; Delay; Fault detection; Fault tolerance; Hardware; Hazards; Maximum likelihood detection; NASA; Weibull distribution; Detection time; fault and error latency; fault injection; hazard rate; maximum likelihood estimator;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1986.1676773
Filename
1676773
Link To Document