DocumentCode
1153946
Title
An open-loop clock deskewing circuit for high-speed synchronous DRAM
Author
Yoo, Changsik
Author_Institution
DRAM Design Team, Samsung Electron., Hwa-Sung, South Korea
Volume
39
Issue
1
fYear
2003
Firstpage
20
Lastpage
21
Abstract
An open-loop clock deskewing circuit (CDC) for high-speed synchronous DRAM is described. Unlike the conventional circuits, the CDC does not require an additional measure delay line, thus power consumption is reduced. The delay is measured directly from the main delay line and both the input and output ports of the delay line are movable. The CDC provides a deskewed clock within two clock cycles.
Keywords
DRAM chips; clocks; delay lines; high-speed integrated circuits; low-power electronics; CDC; clock cycles; delay line; high-speed synchronous DRAM; open-loop clock deskewing circuit; power consumption;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20030077
Filename
1182324
Link To Document