• DocumentCode
    1153946
  • Title

    An open-loop clock deskewing circuit for high-speed synchronous DRAM

  • Author

    Yoo, Changsik

  • Author_Institution
    DRAM Design Team, Samsung Electron., Hwa-Sung, South Korea
  • Volume
    39
  • Issue
    1
  • fYear
    2003
  • Firstpage
    20
  • Lastpage
    21
  • Abstract
    An open-loop clock deskewing circuit (CDC) for high-speed synchronous DRAM is described. Unlike the conventional circuits, the CDC does not require an additional measure delay line, thus power consumption is reduced. The delay is measured directly from the main delay line and both the input and output ports of the delay line are movable. The CDC provides a deskewed clock within two clock cycles.
  • Keywords
    DRAM chips; clocks; delay lines; high-speed integrated circuits; low-power electronics; CDC; clock cycles; delay line; high-speed synchronous DRAM; open-loop clock deskewing circuit; power consumption;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20030077
  • Filename
    1182324