DocumentCode :
1154051
Title :
Silicon nitride direct bonding
Author :
Ismail, Mohamad Safari ; Bower, R.W. ; Veteran, J.L. ; Marsh, O.J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Davis, CA, USA
Volume :
26
Issue :
14
fYear :
1990
fDate :
7/5/1990 12:00:00 AM
Firstpage :
1045
Lastpage :
1046
Abstract :
Direct bonding has been accomplished between silicon nitride coated wafers and both nitride coated and uncoated silicon wafers. Successful bonding occurred when the initial nitride was hydrophilic as deposited or the nitride surface is rendered hydrophilic by a wet oxidation process prior to bonding.
Keywords :
dielectric thin films; integrated circuit technology; semiconductor technology; silicon compounds; Si wafer bonding; Si-Si; Si 3N 4-Si 3N 4 direct bond; wafer direct bond; wet oxidation process;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19900677
Filename :
108007
Link To Document :
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