DocumentCode :
1154192
Title :
A sensitivity-based approach to analyzing signal delay uncertainty of coupled interconnects
Author :
Kulkarni, Medha ; Chen, Tom
Author_Institution :
Sun Microsystems, Sunnyvale, CA, USA
Volume :
24
Issue :
9
fYear :
2005
Firstpage :
1336
Lastpage :
1346
Abstract :
Performance optimization is a critical step in the design of integrated circuits. Rapid advances in very large scale integration (VLSI) technology have enabled shrinking feature sizes, wire widths, and wire spacings, making the effects of coupling capacitance more apparent. As signals switch faster, noise due to coupling between neighboring wires becomes more pronounced. Changing the relative signal arrival times (RSATs) alters the victim line delay due to the varying coupling noise on the victim line. The authors propose a sensitivity-based method to analyze delay uncertainties of coupled interconnects due to uncertain signal arrival times at its inputs. Compared to existing methods of analyzing delay uncertainties of coupled interconnects, the simulation results show that the proposed method strikes a good balance between model accuracy and complexity compared to the existing approaches.
Keywords :
VLSI; circuit CAD; circuit complexity; crosstalk; delays; failure analysis; fault simulation; integrated circuit design; integrated circuit interconnections; integrated circuit noise; sensitivity; timing; RSAT; VLSI technology; coupled interconnects; coupling capacitance; coupling noise; integrated circuits design; line delay; relative signal arrival times; sensitivity approach; signal delay uncertainty; signal switch; statistical timing; very large scale integration; Coupling circuits; Delay; Integrated circuit interconnections; Integrated circuit technology; Optimization; Signal analysis; Switches; Uncertainty; Very large scale integration; Wire; Coupled interconnects; delay changes; sensitivity; signal arrival times; statistical timing;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2005.852059
Filename :
1501899
Link To Document :
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