• DocumentCode
    1154221
  • Title

    BITL format: a way of representing boundary scan test vectors

  • Author

    De Jong, F.

  • Author_Institution
    Philips Centre for Manuf., Eindhoven, Netherlands
  • Volume
    26
  • Issue
    14
  • fYear
    1990
  • fDate
    7/5/1990 12:00:00 AM
  • Firstpage
    1072
  • Lastpage
    1073
  • Abstract
    A set of test vectors for a digital board can be written as an ASCII list presenting binary values. This representation is not adequate for shifting in or shifting out boundary scan data. A new vector representation is defined called ´BST integrated test-vector list´ (BITL).
  • Keywords
    automatic test equipment; logic testing; printed circuit testing; ASCII list presenting binary values; BITL format; BST integrated test-vector list; boundary scan data; digital PCB testing; digital board testing; representing boundary scan test vectors; set of test vectors; vector representation;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19900694
  • Filename
    108023