DocumentCode
1154221
Title
BITL format: a way of representing boundary scan test vectors
Author
De Jong, F.
Author_Institution
Philips Centre for Manuf., Eindhoven, Netherlands
Volume
26
Issue
14
fYear
1990
fDate
7/5/1990 12:00:00 AM
Firstpage
1072
Lastpage
1073
Abstract
A set of test vectors for a digital board can be written as an ASCII list presenting binary values. This representation is not adequate for shifting in or shifting out boundary scan data. A new vector representation is defined called ´BST integrated test-vector list´ (BITL).
Keywords
automatic test equipment; logic testing; printed circuit testing; ASCII list presenting binary values; BITL format; BST integrated test-vector list; boundary scan data; digital PCB testing; digital board testing; representing boundary scan test vectors; set of test vectors; vector representation;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19900694
Filename
108023
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