DocumentCode :
1154352
Title :
A Model-Spectrum-Based Flattening Algorithm for Airborne Single-Pass SAR Interferometry
Author :
Xiang, Zheng ; Wang, Kaizhi ; Liu, Xingzhao
Author_Institution :
Dept. of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai
Volume :
6
Issue :
2
fYear :
2009
fDate :
4/1/2009 12:00:00 AM
Firstpage :
307
Lastpage :
311
Abstract :
An effective method is proposed to remove the flat-Earth phase (i.e., flattening) in airborne single-pass interferometric synthetic aperture radar (InSAR) imaging. Two conventional flattening methods, namely, the orbit-equation algorithm and the fringe-frequency algorithm, are used for comparison. The orbit-equation algorithm is theoretically accurate, but the orbit ephemeris that it requires is maybe inaccurate or even unknown. The fringe-frequency algorithm is effective in spaceborne InSAR flattening, but in airborne cases, a phase trend will remain in the residual interferogram with this method. To overcome these limitations, this letter presents a novel flattening algorithm by combining the two conventional methods for airborne single-pass InSAR flattening. By exploiting a reasonable model of the flat-Earth phase and the spectrum information of the practical interferogram, the proposed algorithm is able to flatten the interferogram accurately without knowledge of the airplane trajectory (except for the airplane height). Finally, some experimental results demonstrate the effectiveness of the proposed flattening algorithm.
Keywords :
airborne radar; digital elevation models; geophysical techniques; radar interferometry; remote sensing by radar; synthetic aperture radar; topography (Earth); InSAR imaging; airborne single-pass interferometric synthetic aperture radar; conventional flattening methods; flat-Earth phase remove; fringe-frequency algorithm; orbit-equation algorithm; practical interferogram; spectrum information; Complex interferogram; digital elevation model (DEM); flat-Earth phase removal; synthetic aperture radar (SAR) interferometry;
fLanguage :
English
Journal_Title :
Geoscience and Remote Sensing Letters, IEEE
Publisher :
ieee
ISSN :
1545-598X
Type :
jour
DOI :
10.1109/LGRS.2009.2012440
Filename :
4781799
Link To Document :
بازگشت