Title : 
A Complete Noise- and Scattering-Parameters Test-Set
         
        
            Author : 
Garelli, Marco ; Ferrero, Andrea ; Bonino, Serena
         
        
            Author_Institution : 
Dept. of Electron., Politec. di Torino, Turin
         
        
        
        
        
            fDate : 
3/1/2009 12:00:00 AM
         
        
        
        
            Abstract : 
We present an innovative test-set based on a microwave tuner, a vector network analyzer and a Y-factor receiver capable of extracting the noise and the scattering parameters of a two-port device. To the authors´ knowledge, the presented test-set is the first noise system that avoids the use of any microwave switch in the noise measurement branches. A set of reflectometers and a novel calibration scheme are used to measure the tuner´s loss and S-parameters in real time without any tuner precharacterization.
         
        
            Keywords : 
S-parameters; calibration; electric noise measurement; microwave reflectometry; reflectometers; S-parameters measurement; Y-factor receiver; calibration scheme; microwave switch; microwave tuner; noise extraction; noise measurement branches; noise-parameters test-set; reflectometers; scattering-parameters test-set; tuner loss measurement; vector network analyzer; Amplifier measurement; multiport scattering calibration; noise figure; noise parameters; scattering calibration; unknown thru;
         
        
        
            Journal_Title : 
Microwave Theory and Techniques, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TMTT.2009.2013315