DocumentCode :
1154487
Title :
Compact laser-diode sources for optical inspection probes
Author :
Bachhuber, Mark R. ; Lorenz, Robert D.
Volume :
25
Issue :
4
fYear :
1989
Firstpage :
652
Lastpage :
657
Abstract :
The use of laser diode sources rather than conventional tube lasers to provide the illumination for many optical probe applications is considered. The technical issues addressed include temperature control, output intensity control, and collimation of the light output. Possible solutions, as well as experimental results from a laboratory optical probe developed using a laser diode source, are presented
Keywords :
inspection; laser beam applications; probes; semiconductor junction lasers; collimation; illumination; laser diode sources; optical inspection probes; output intensity control; semiconductor junction lasers; temperature control; Diode lasers; Gas lasers; Head; Inspection; Laser beams; Lenses; Lighting; Optical sensors; Photodetectors; Probes;
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/28.31242
Filename :
31242
Link To Document :
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