DocumentCode :
1154733
Title :
A MOSFET-C variable equalizer circuit with simple on-chip automatic tuning
Author :
Sakurai, Satoshi ; Ismail, Mohammed ; Michel, Jean-Yves ; Sanchez-Sinencio, Edgar ; Brannen, Robert
Author_Institution :
Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
Volume :
27
Issue :
6
fYear :
1992
fDate :
6/1/1992 12:00:00 AM
Firstpage :
927
Lastpage :
934
Abstract :
The authors report a MOSFET-C variable bump equalizer architecture in MOS technology. The architecture is CAD-compatible in that it has a fixed physical layout, yet it achieves independent and continuous programmability of the three equalizer parameters ω0 (center frequency), BW (bandwidth), and G (gain), using DC control voltages. To compensate for process and temperature variations the equalizer is tuned using a novel and simple master-slave automatic tuning scheme based on a switched-capacitor resistor in a gain control loop. The nonideal effects of the equalizer circuit due to finite amplifier gain bandwidth are studied, and a test chip is fabricated using the MOSIS 2-μm p-well double-poly CMOS process to verify the performance. The equalizer with the automatic tuning circuit occupies 1.25 mm2 and operates from ±5-V power supplies. It dissipates 60 mW and provides wide tuning ranges for ω0, BW, and G with less than 2.8% change in ω0 over a 40°C temperature range
Keywords :
CMOS integrated circuits; equalisers; linear integrated circuits; tuning; -5 V; 2 micron; 5 V; 60 mW; DC control voltages; MOSFET-C variable equalizer circuit; MOSIS; bandwidth; center frequency; continuous programmability; finite amplifier gain bandwidth; gain control loop; master-slave automatic tuning scheme; on chip tuning; p-well double-poly CMOS process; switched-capacitor resistor; variable bump equalizer architecture; Bandwidth; Circuit optimization; Circuit testing; Equalizers; Frequency; MOSFET circuits; Master-slave; Resistors; Tuning; Voltage control;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.135337
Filename :
135337
Link To Document :
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