• DocumentCode
    1155051
  • Title

    Discussion, with reply, on "Estimating the cumulative probability of failure data points to be plotted on Weibull and other probability paper

  • Author

    Cacciari, Matteo ; Montanari, Gian

  • Volume
    26
  • Issue
    6
  • fYear
    1991
  • Firstpage
    1224
  • Lastpage
    1229
  • Abstract
    It is pointed out that the Bernard estimator is very accurate, with respect to other median or mean approximated ranks, confirming results presented by J.C. Fothergill in the above-titled paper (see ibid., vol.25, p.489-92, 1990). However, it is argued that the weighted Blom seems the most accurate estimator, among graphical ones, for normally sized samples and a reliable one for small sample sizes, although the Bernard and Filliben estimators are better than Weibull and Blom for small sample sizes. Statistical and graphical estimators are compared by plotting the percent deviations of the values of the Weibull parameters alpha and beta (scale and shape parameters, respectively) estimated by weighted Blom, Bernard, Weibull, maximum likelihood estimation (MLE), and Bain-Engelhardt (BE), with respect to the true values, as well as the estimates obtained by MLE and BE, as functions of the sample size. In replying, Fothergill states that for small sample sizes, the advantages of more sophisticated techniques do not seem warranted.<>
  • Keywords
    ageing; estimation theory; failure analysis; probability; reliability theory; statistical analysis; Bain Engelhardt estimation; Bernard estimator; Filliben estimators; Weibull estimator; Weibull parameters; cumulative probability; failure data points; graphical estimators; maximum likelihood estimation; sample sizes; statistical estimators; weighted Blom; Aging; Breakdown voltage; Data processing; Dielectrics and electrical insulation; Equations; IEC standards; Insulation testing; Maximum likelihood estimation; Parameter estimation; Probability;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/14.108163
  • Filename
    108163