DocumentCode :
1155067
Title :
Thermal strain analysis in optical planar waveguides
Author :
Zhao, Xiuli ; Xu, Y.Z. ; Li, Chunfei
Author_Institution :
Dept. of Phys., Harbin Inst. of Technol., China
Volume :
15
Issue :
3
fYear :
2003
fDate :
3/1/2003 12:00:00 AM
Firstpage :
398
Lastpage :
400
Abstract :
For the first time, we derive an analytical form of the thermal-induced strain equation for the waveguide core layer in an optical planar waveguide, which is based on elastic interaction theory in multilayered isotropic structures off the edges by thin-film approximation. This derived equation addresses how material and structural characteristics affect the magnitude and the distribution of the strain. By this equation, the strain-induced birefringence can be reduced or eliminated by proper waveguide design.
Keywords :
mechanical birefringence; optical planar waveguides; optical waveguide theory; thermal expansion; thermo-optical effects; analytical form; elastic interaction theory; material characteristics; multilayered isotropic structures; optical planar waveguide; strain-induced birefringence; structural characteristics; thermal strain analysis; thermal-induced strain equation; thin-film approximation; waveguide core layer; waveguide design; Birefringence; Capacitive sensors; Optical films; Optical planar waveguides; Optical waveguide theory; Optical waveguides; Planar waveguides; Substrates; Thermal expansion; Thermal stresses;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2002.807924
Filename :
1182770
Link To Document :
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