DocumentCode :
1155092
Title :
A 90-nm FPGA I/O buffer design with 1.6-Gb/s data rate for source-synchronous system and 300-MHz clock rate for external memory interface
Author :
Tyhach, Jeffrey ; Wang, Xiaobao ; Sung, Chiakang ; Huang, Joseph ; Nguyen, Khai ; Xiaobao Wang ; Chong, Yan ; Pan, Philip ; Kim, Henry ; Rangan, Gopinath ; Chang, Tzung-Chin ; Tan, Johnson
Author_Institution :
Altera Corp., San Jose, CA, USA
Volume :
40
Issue :
9
fYear :
2005
Firstpage :
1829
Lastpage :
1838
Abstract :
As FPGAs integrate into high-speed systems, performance and signal integrity become more important in I/O design. This paper describes the development of an FPGA design to support 1.6 Gb/s differential source-synchronous standards and 300 MHz external memory interfaces. Speed and performance were achieved using circuits such as differential level-shifters with voltage and temperature compensated current sources, on-chip decoupling capacitors, and floating-well output buffers. Programmable drive strength, output impedance matching, hot-socketing compliance, and 3.3-V voltage tolerance are features of the I/O buffer. In addition, DLLs and programmable phase-offset circuits were used to obtain precise timing control. The chip was manufactured on a 90-nm CMOS process.
Keywords :
buffer storage; delay lock loops; field programmable gate arrays; logic design; peripheral interfaces; 1.6 Gbit/s; 3.3 V; 300 MHz; 90 nm; CMOS process; DLL; FPGA I/O buffer; LVDS; delay circuits; delay-locked loops; differential level-shifters; external memory interface; floating-well output buffers; high-speed systems; high-speed techniques; hot-socketing compliance; on-chip decoupling capacitors; output impedance matching; programmable drive strength; programmable phase-offset circuit; single-ended I/O; source-synchronous system; temperature compensated current sources; timing control; voltage compensated current sources; Capacitors; Circuits; Clocks; Field programmable gate arrays; Impedance matching; Signal design; Standards development; Temperature; Timing; Voltage; 90 nm; I/O; LVDS; delay circuits; delay-locked loops (DLLs); high-speed techniques; single-ended I/O;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2005.852156
Filename :
1501981
Link To Document :
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