Title :
EM and substrate coupling in silicon RFICs
Author :
Amaya, Rony ; Popplewell, Peter H R ; Cloutier, Mark ; Plett, Calvin
Author_Institution :
Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada
Abstract :
An investigation of coupling between inductors and resonators fabricated in silicon substrates is presented and the effects on RF systems and components are discussed. A novel experimental technique to measure inductor and resonator coupling is presented. The experiment is extremely sensitive, fast, accurate, and unique in that no matching, probe de-embedding, or calibration is necessary as the ratio of two on-chip signals is measured to yield the results.
Keywords :
electromagnetic coupling; injection locked oscillators; integrated circuit design; microwave integrated circuits; substrates; EM coupling; RFIC; inductor coupling measurement; resonator coupling measurement; substrate coupling; Circuit simulation; Coupling circuits; Inductance; Inductors; Injection-locked oscillators; Radio frequency; Radiofrequency integrated circuits; Silicon; Transmitters; Voltage-controlled oscillators; EM coupling; RFIC; injection locking; silicon; substrate coupling;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2005.848178
