DocumentCode :
1155335
Title :
Numerical modeling of hot electrons in n-GaAs Schottky-barrier diodes
Author :
Hjelmgren, Hans
Author_Institution :
Dept. of Appl. Electron Phys., Chalmers Univ. of Technol., Goteborg, Sweden
Volume :
37
Issue :
5
fYear :
1990
fDate :
5/1/1990 12:00:00 AM
Firstpage :
1228
Lastpage :
1234
Abstract :
The drift-diffusion model, with the inclusion of the energy balance equations, is used to model DC properties of n-GaAs Schottky diodes at high forward bias voltages. The boundary condition for the energy balance equation at the Schottky contact is based on the assumption that the energy flow across the interface is equal to the energy carried by the electrons. The effects of thermionic-field emission and image force lowering are modeled with a field-dependent barrier height. The incorporation of these two effects resulted in very good agreement between simulated and measured I-V characteristics for diodes with different doping concentrations of the epitaxial layer
Keywords :
III-V semiconductors; Schottky-barrier diodes; gallium arsenide; hot carriers; semiconductor device models; DC properties; GaAs; I-V characteristics; boundary condition; drift-diffusion model; energy balance equations; field-dependent barrier height; high forward bias voltages; hot electrons; image force lowering; n-GaAs Schottky-barrier diodes; numerical modelling; thermionic-field emission; Boundary conditions; Electrons; Equations; Numerical models; Schottky barriers; Schottky diodes; Semiconductor process modeling; Thermal force; Thermionic emission; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.108183
Filename :
108183
Link To Document :
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