DocumentCode
1156153
Title
Coifman wavelets in 3-D scattering from very rough random surfaces
Author
Pan, Guangwen W. ; Wang, Ke ; Cochran, Douglas
Author_Institution
Electr. Eng. Dept., Arizona State Univ., Tempe, AZ, USA
Volume
52
Issue
11
fYear
2004
Firstpage
3096
Lastpage
3103
Abstract
The Coifman wavelets are employed to perform Galerkin´s procedure in the method of moments (MoM). The Coiflets are continuous, smooth, overlapping, yet orthogonal, which permit significant reduction of the sampling rate and dramatic compression of the matrix size with respect to the pulse based MoM. In addition, the wavelet based impedance matrix is sparse. More importantly, the vanishing moments of the Coiflets of order L=4 provide us with high precision O(h5) one-point quadrature, which knocks down the computational effort in filling the matrix entries from O(n2) to O(n). Our approach is different from the conventional wavelet technique, which employs wavelets to sparsify an existing impedance matrix under similarity transformation with computational cost in O(n2). Excellent agreement between this Coifman wavelet method and the previous publications is observed.
Keywords
Galerkin method; Green´s function methods; electromagnetic wave scattering; impedance matrix; magnetic field integral equations; method of moments; rough surfaces; sparse matrices; wavelet transforms; 3-D scattering; Coiflet; Coifman wavelet; Galerkin´s procedure; Green´s function; MFIE; MoM; computational cost; electromagnetic scattering; high precision one-point quadrature; impedance matrix; magnetic field integral equation; matrix entry; matrix size compression; method of moments; rough random surface; sampling rate; sparse matrix; Filling; Impedance; Moment methods; Pulse compression methods; Rough surfaces; Sampling methods; Scattering; Sparse matrices; Surface roughness; Surface waves; 65; Green´s function; magnetic field integral equation; rough surface; wavelets;
fLanguage
English
Journal_Title
Antennas and Propagation, IEEE Transactions on
Publisher
ieee
ISSN
0018-926X
Type
jour
DOI
10.1109/TAP.2004.835127
Filename
1353508
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