Title : 
Three-dimensional model of gate current flow in thyristor. I. Description
         
        
            Author : 
Lisik, Zbigniew ; Turowski, Marek
         
        
            Author_Institution : 
Inst. of Electron., Tech. Univ., Lodz, Poland
         
        
        
        
        
            fDate : 
5/1/1990 12:00:00 AM
         
        
        
        
            Abstract : 
The digital gate concept is one of the fundamental ways leading to improvement of the dynamic rates of a thyristor. The distribution of the current density of the gate-cathode junction along the edge of the gate contact must, however, be as uniform as possible. A numerical model which permits determination of this distribution, the initial turn-on area, and their dependence on constructional parameters is proposed. The three-dimensional model includes the gate contact layer, the cathode layer, and the p-base layer. It consists of two coupled submodels: a one-dimensional submodel describing the current flow through the arm of the gate contact, and a two-dimensional one modeling the current flow inside the semiconductor bulk of the thyristor. The second submodel was developed in two versions: an exact 2-D submodel based on the solution of the semiconductor structure equations, and a lumped-parameter GP submodel based on the Gummel-Poon approach. The proposed model allows fast multiple analysis even on a personal computer
         
        
            Keywords : 
current density; electronic engineering computing; semiconductor device models; thyristors; 2D submodel; Gummel-Poon approach; cathode layer; current density distribution; digital gate concept; dynamic rates; gate contact layer; gate current flow; gate-cathode junction; lumped-parameter GP submodel; numerical model; one-dimensional submodel; p-base layer; semiconductor structure equations; three-dimensional model; thyristor; turn-on area; Application software; Cathodes; Current density; Doping profiles; Electrodes; Helium; Microcomputers; Numerical models; Poisson equations; Thyristors;
         
        
        
            Journal_Title : 
Electron Devices, IEEE Transactions on