• DocumentCode
    1156282
  • Title

    Numerical method to compute TE and TM multiple scatter from rough surfaces exhibiting backscatter enhancement

  • Author

    El-Shenawee, Magda ; Bahar, Evckiel

  • Author_Institution
    Dept. of Electr. Eng., Nebraska Univ., Lincoln, NE, USA
  • Volume
    30
  • Issue
    5
  • fYear
    1994
  • fDate
    9/1/1994 12:00:00 AM
  • Firstpage
    3140
  • Lastpage
    3143
  • Abstract
    A numerical method is presented to evaluate the full wave solutions for TE (horizontally polarized) and TM (vertically polarized) double scatter cross sections of one dimensional random rough surfaces. The full wave double scatter cross sections are expressed in terms of six dimensional integrals. The cpu time needed to evaluate the six dimensional integrals using standard techniques is excessive even for supercomputers. A numerical technique is used to reduce the six dimensional integrals into three dimensional integrals (one dimensional integral calling two independent two dimensional integrals). These two dimensional integrals account for the correlations between the heights and slopes at two points on the surface. The results exhibit the observed sharp enhanced backscatter and the polarization dependence of the cross sections. The angular width and the magnitude of the enhanced backscatter depend on the rough surface parameters (mean square height and slope)
  • Keywords
    backscatter; electromagnetic wave scattering; integral equations; numerical analysis; 1D rough surfaces; TE scatter; TM scatter; backscatter enhancement; double scatter cross sections; full wave solutions; horizontally polarized wave; multiple scatter; numerical method; one dimensional random rough surfaces; polarization dependence; six dimensional integrals; three dimensional integrals; vertically polarized wave; Backscatter; Conductors; Electromagnetic scattering; Fellows; Polarization; Rough surfaces; Supercomputers; Surface roughness; Surface waves; Tellurium;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.312603
  • Filename
    312603