Title :
Experimental characterization procedure for use with an advanced induction machine model
Author :
Sudhoff, Scott D. ; Aliprantis, Dionysios C. ; Kuhn, Brian T. ; Chapman, Patrick L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fDate :
3/1/2003 12:00:00 AM
Abstract :
An advanced induction motor model that includes stator leakage saturation, rotor leakage saturation, magnetizing saturation, and distributed system effects in the rotor circuits has been set forth. This model is considerably more accurate than traditional models, particularly in terms of predicting switching-frequency dynamics. The model proposed is very general in terms of the range of magnetic properties that can be incorporated. This paper provides suggestions for specific forms for the leakage and magnetizing characteristics and derives the resulting small-signal impedance and large-signal steady-state equivalent circuit. Based on these results, a test procedure for experimentally characterizing the machine is developed. The application of the procedure to a 50-hp test machine is included as an example.
Keywords :
electric admittance; electric impedance measurement; equivalent circuits; induction motors; machine theory; magnetic flux; magnetic variables measurement; magnetisation; rotors; stators; transfer functions; 460 V; 50 hp; 60 Hz; advanced induction machine model; distributed system effects; equivalent circuits; frequency measurement; frequency response; large-signal steady-state equivalent circuit; leakage characteristics; magnetic properties; magnetizing characteristics; magnetizing saturation; parameter estimation; rotor circuits; rotor leakage saturation; small-signal impedance; stator leakage saturation; switching-frequency dynamics; test procedure; transfer functions; Circuit testing; Impedance; Induction machines; Induction motors; Magnetic circuits; Magnetic properties; Predictive models; Rotors; Saturation magnetization; Stators;
Journal_Title :
Energy Conversion, IEEE Transactions on
DOI :
10.1109/TEC.2002.808333