DocumentCode :
1156698
Title :
Pre-Silicon Modeling and Analysis: Impact On Real Design
Author :
Bose, Pradip
Volume :
26
Issue :
4
fYear :
2006
Firstpage :
3
Lastpage :
3
Abstract :
Micro editor in chief Pradip Bose talks about the challenge of predicting and tuning a microprocessor´s net quality well before its tape out and eventual production cycle.
Keywords :
CMOS; Pre-silicon modeling; performance modeling; Computational modeling; Field programmable gate arrays; Frequency; Hardware; Investments; Multicore processing; Power system reliability; Production; Robustness; Semiconductor device modeling; CMOS; Pre-silicon modeling; performance modeling;
fLanguage :
English
Journal_Title :
Micro, IEEE
Publisher :
ieee
ISSN :
0272-1732
Type :
jour
DOI :
10.1109/MM.2006.78
Filename :
1677496
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1156698
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