DocumentCode :
1156854
Title :
Understanding MOSFET mismatch for analog design
Author :
Drennan, Patrick G. ; McAndrew, Colin C.
Author_Institution :
Motorola Inc., Tempe, AZ, USA
Volume :
38
Issue :
3
fYear :
2003
fDate :
3/1/2003 12:00:00 AM
Firstpage :
450
Lastpage :
456
Abstract :
Despite the significance of matched devices in analog circuit design, mismatch modeling for design application has been lacking. This paper addresses misconceptions about MOSFET mismatch for analog design. Vt mismatch does not follow a simplistic 1/(√area) law, especially for wide/short and narrow/long devices, which are common geometries in analog circuits. Further, Vt and gain factor are not appropriate parameters for modeling mismatch. A physically based mismatch model can be used to obtain dramatic improvements in prediction of mismatch. This model is applied to MOSFET current mirrors to show some nonobvious effects over bias, geometry, and multiple-unit devices.
Keywords :
MOSFET; SPICE; analogue integrated circuits; current mirrors; integrated circuit design; semiconductor device models; MOSFET current mirrors; MOSFET mismatch; SPICE; analog IC design; analog circuit design; gain factor; physically based mismatch model; semiconductor device modeling; threshold voltage mismatch; Analog circuits; Analog integrated circuits; Computational geometry; Immune system; MOSFET circuits; Mirrors; Predictive models; SPICE; Semiconductor device modeling; Solid modeling;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2002.808305
Filename :
1183852
Link To Document :
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