Title :
Integral Invariants for Shape Matching
Author :
Manay, S. ; Cremers, D. ; Byung-Woo Hong ; Yezzi, A.J. ; Soatto, S.
Author_Institution :
Div. of Electron. Eng. Technol., Lawrence Livermore Nat. Lab., CA
Abstract :
For shapes represented as closed planar contours, we introduce a class of functionals which are invariant with respect to the Euclidean group and which are obtained by performing integral operations. While such integral invariants enjoy some of the desirable properties of their differential counterparts, such as locality of computation (which allows matching under occlusions) and uniqueness of representation (asymptotically), they do not exhibit the noise sensitivity associated with differential quantities and, therefore, do not require presmoothing of the input shape. Our formulation allows the analysis of shapes at multiple scales. Based on integral invariants, we define a notion of distance between shapes. The proposed distance measure can be computed efficiently and allows warping the shape boundaries onto each other; its computation results in optimal point correspondence as an intermediate step. Numerical results on shape matching demonstrate that this framework can match shapes despite the deformation of subparts, missing parts and noise. As a quantitative analysis, we report matching scores for shape retrieval from a database
Keywords :
database management systems; edge detection; geometry; image matching; Euclidean group; closed planar contours; database; integral invariants; quantitative analysis; shape matching; shape retrieval; Application software; Computational geometry; Image databases; Image recognition; Image reconstruction; Information retrieval; Multi-stage noise shaping; Noise shaping; Shape measurement; Spatial databases; Integral invariants; shape; shape distance; shape matching; shape retrieval.; Algorithms; Artificial Intelligence; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Subtraction Technique;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2006.208