DocumentCode :
1156911
Title :
An AI-calibrated IF filter: a yield enhancement method with area and power dissipation reductions
Author :
Murakawa, Masahiro ; Adachi, Toshio ; Niino, Yoshihiro ; Kasai, Yuji ; Takahashi, Eiichi ; Takasuka, Kaoru ; Higuchi, Tetsuya
Author_Institution :
Adv. Semicond. Res. Center, Nat. Inst. of Adv. Ind. Sci. & Technol., Ibaraki, Japan
Volume :
38
Issue :
3
fYear :
2003
fDate :
3/1/2003 12:00:00 AM
Firstpage :
495
Lastpage :
502
Abstract :
We have developed a large-scale integration (LSI) for Gm-C intermediate frequency (IF) filters, attaining a 63% reduction in filter area, a 26% reduction in power dissipation, compared with existing commercial products using the same process technology and filter topology, and a yield rate of 97%. The developed chip is calibrated within a few seconds by a genetic algorithm - an efficient AI technique for difficult optimization problems. Our calibration method, which can be applied to a wide variety of analog circuits, leads to cost reductions and the efficient implementation of analog LSIs.
Keywords :
CMOS analogue integrated circuits; active filters; calibration; cascade networks; circuit optimisation; genetic algorithms; integrated circuit testing; integrated circuit yield; large scale integration; low-power electronics; 440 to 470 kHz; AI-calibrated IF filter; Gm-C intermediate frequency filters; analog LSIs; analog circuits; area reduction; cascaded sixth-order cells; chip calibration; double-poly double-metal N-CMOS process; filter area; filter topology; frequency response; genetic algorithm; large-scale integration; optimization problems; power dissipation reduction; yield enhancement method; yield rate; Analog circuits; Artificial intelligence; Calibration; Circuit topology; Costs; Filters; Frequency; Genetic algorithms; Large scale integration; Power dissipation;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2002.808303
Filename :
1183858
Link To Document :
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