Title :
Single-wafer integrated semiconductor device processing
Author :
Moslehi, Mehrdad M. ; Chapman, Richard A. ; Wong, Man ; Paranjpe, Ajit ; Najm, Habib N. ; Kuehne, John ; Yeakley, Richard L. ; Davis, Cecil J.
Author_Institution :
Texas Instrum., Dallas, TX, USA
fDate :
1/1/1992 12:00:00 AM
Abstract :
The authors present an overview of various single-wafer fabrication techniques for integrated processing of microelectronic devices. Numerous processing modules, sensors, and associated fabrication processes have been developed for advanced semiconductor device manufacturing. The combination of single-wafer processing, cluster tools, sensors, and advanced factory control/computer-integrated manufacturing techniques provides a capability for flexible fast-cycle-time device manufacturing. Specific developments and results are described in the areas of dry/vapor-phase surface cleaning, epitaxy, plasma processing, rapid thermal processing, and in situ sensors. An integrated sub-half micrometer CMOS technology based on these single-wafer fabrication methods including rapid thermal processing is also described
Keywords :
CMOS integrated circuits; incoherent light annealing; integrated circuit manufacture; process control; reviews; semiconductor technology; surface treatment; vapour phase epitaxial growth; CMOS technology; cluster tools; dry/vapor-phase surface cleaning; epitaxy; factory control/computer-integrated manufacturing techniques; flexible fast-cycle-time device manufacturing; integrated processing; microelectronic devices; overview; plasma processing; processing modules; rapid thermal processing; semiconductor device manufacturing; semiconductor device processing; sensors; single-wafer fabrication; CMOS technology; Computer aided manufacturing; Computer integrated manufacturing; Fabrication; Manufacturing processes; Microelectronics; Production facilities; Rapid thermal processing; Semiconductor device manufacture; Semiconductor devices;
Journal_Title :
Electron Devices, IEEE Transactions on