A method of computing the sensitivity of electromagnetic quantities to changes in materials and sources

Author

Dyck, D.N. ; Lowther, D.A. ; Freeman, E.M.

Author_Institution

Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada

Volume

30

Issue

5

fYear

1994

fDate

9/1/1994 12:00:00 AM

Firstpage

3415

Lastpage

3418

Abstract

This paper presents a method of computing the sensitivity of electromagnetic quantities (e.g. induced voltage, force, field uniformity) to perturbations in sources and material parameters. The method applies to systems with linear materials and time harmonic source currents; static problems are included as a special case. Sensitivity is equivalent to the derivative with respect to the distributed system parameters. Therefore, with the expressions for the sensitivity presented in this paper, first order optimization methods can be applied to optimization problems in electromagnetics. Applications are in the area of inverse problems, including electromagnetic device design, device optimization, and imaging

Keywords

electromagnetic devices; electromagnetic field theory; electromagnetic induction; inverse problems; optimisation; sensitivity; distributed system parameters; electromagnetic device design; electromagnetic device optimization; electromagnetic quantities; field uniformity; force; imaging; induced voltage; inverse problems; linear materials; sensitivity; static problems; time harmonic source currents; Conductivity; Educational institutions; Electromagnetic fields; Inverse problems; Iterative algorithms; Linear approximation; Magnetostatics; Maxwell equations; Optimization methods; Permeability;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.312672

Filename

312672