DocumentCode
1156967
Title
ASIC testing upgraded
Author
Levitt, Marc E.
Author_Institution
Sun Microsystems Inc., Mountain View, CA, USA
Volume
29
Issue
5
fYear
1992
fDate
5/1/1992 12:00:00 AM
Firstpage
26
Lastpage
29
Abstract
Nontraditional test methods being developed in response to the demand for quality parts in short development times are described. The need for a complete economic model that includes the time-to-market and quality costs associated with testing along with the usual test pattern generation and test hardware costs is discussed. The limitations of current approaches are identified, and three new methods-scan (in a variety of forms), built-in-self-test, and massive observability-are examined, and their advantages and drawbacks are considered.<>
Keywords
application specific integrated circuits; integrated circuit testing; ASIC; built-in-self-test; massive observability; nontraditional test methods; quality costs; scan; test hardware costs; test pattern generation costs; time-to-market costs; Application specific integrated circuits; Assembly systems; Automatic testing; Built-in self-test; Costs; Delay; Marketing and sales; Sun; Thumb; Turning;
fLanguage
English
Journal_Title
Spectrum, IEEE
Publisher
ieee
ISSN
0018-9235
Type
jour
DOI
10.1109/6.135405
Filename
135405
Link To Document