Title :
ASIC testing upgraded
Author_Institution :
Sun Microsystems Inc., Mountain View, CA, USA
fDate :
5/1/1992 12:00:00 AM
Abstract :
Nontraditional test methods being developed in response to the demand for quality parts in short development times are described. The need for a complete economic model that includes the time-to-market and quality costs associated with testing along with the usual test pattern generation and test hardware costs is discussed. The limitations of current approaches are identified, and three new methods-scan (in a variety of forms), built-in-self-test, and massive observability-are examined, and their advantages and drawbacks are considered.<>
Keywords :
application specific integrated circuits; integrated circuit testing; ASIC; built-in-self-test; massive observability; nontraditional test methods; quality costs; scan; test hardware costs; test pattern generation costs; time-to-market costs; Application specific integrated circuits; Assembly systems; Automatic testing; Built-in self-test; Costs; Delay; Marketing and sales; Sun; Thumb; Turning;
Journal_Title :
Spectrum, IEEE
